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dc.coverage.spatialGeneración de conocimiento
dc.creatorCESAR RENAN ACOSTA A
dc.dateinfo:eu-repo/date/embargoEnd/2099-12-31
dc.date2017-06-15
dc.date.accessioned2018-10-04T16:06:22Z
dc.date.available2018-10-04T16:06:22Z
dc.identifierhttps://link.springer.com/article/10.1007/s10854-017-7334-3
dc.identifier.urihttp://redi.uady.mx:8080/handle/123456789/2234
dc.language
dc.publisherJournal of Materials Science: Materials in Eletronics
dc.relationcitation:0
dc.rightsinfo:eu-repo/semantics/embargoedAccess
dc.sourceurn:issn:0957-4522
dc.subjectinfo:eu-repo/classification/cti/7
dc.subjectINGENIERÍA Y TECNOLOGÍA
dc.titleCorrelation of residual stress variations to electrical properties changes in ZNO thin films.
dc.typeinfo:eu-repo/semantics/article


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